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SOA Best Practices Authors: Jason Bloomberg, Hollis Tibbetts, Pat Romanski, Liz McMillan, Lori MacVittie

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STC's Upcoming Global OPENSTAR Conference Supports Consortium's Charter to Further the Open Architecture Ecosystem to Provide Certified Test Solutions

STC's Upcoming Global OPENSTAR Conference Supports Consortium's Charter to Further the Open Architecture Ecosystem to Provide Ce

SAN DIEGO, Dec. 5 /PRNewswire/ -- The Semiconductor Test Consortium, Inc. (STC), the leading promoter of the global adoption of the Open Semiconductor Test Architecture (OPENSTAR(R)) standard, today announced further details of their first annual Global OPENSTAR Conference (GOC), in addition to participation in SEMICON Japan 2005. Created in direct response to industry- wide demand for open-architecture test solutions, the STC's entirely OPENSTAR- focused inaugural conference aims to further develop the open architecture ecosystem, while bringing the growing roster of STC members together to promote both vendor capabilities and user needs. The venue will also enable international members that span the globe to meet face-to-face, which in turn will create an open forum enabling collaboration for advancing the open architecture framework and test solutions infrastructure to meet the ever- changing demands of the automated test equipment (ATE) industry.

Open to all STC members as well as other semiconductor, equipment and instrumentation companies, the first annual GOC will be held from March 6 through 8, 2006, at the Portola Plaza Hotel in Monterey, California. The opening day agenda will focus on the "Future of the Industry," and will kick off with an opening keynote address followed by insightful presentations from leading industry companies. The second day's theme is targeted toward the "Migration of the Supply Base," offering multiple tracks covering topics such as STC value contributions, standards opportunities, instrument development, analyst views, software development and supplier presentations. The third day agenda -- "Addressing User Requirements" -- will also include multiple tracks addressing user perspectives, the real impact of open architecture, the STC University program and user presentations. Additional GOC information can be found at http://www.semitest.org/, and will also be available at the STC booth during SEMICON Japan 2005.

"This year, the STC has held 18 regional meetings around the world in China, France, Germany, Japan, Taiwan and the United States. Next March, we will bring our worldwide members together for the first time to engage in furthering the development of the open architecture ecosystem. Given our broad range of member companies, this inaugural venue will bring together end users and equipment vendors working in concert within a truly open architecture framework supported by a test solutions development infrastructure, which are all absolutely necessary in today's dynamic world," explained Don Edenfeld, STC Board Member and GOC Chairman. "With over 60 user, vendor, STIL and university members eagerly looking forward to actively participating in this first OPENSTAR-focused worldwide event, it is sure to be a success," Edenfeld added.

With a primary focus on worldwide STC activity, the STC's SEMICON Japan booth (11B-205) will feature a diverse array of OPENSTAR-compliant modules including a 6.5 GHz digital module from Advantest, an 800 MHz baseband AWG and digitizer from Apria Technology and an RF transceiver measurement unit from Roos Instruments. In conjunction with the exhibit, the STC will hold a general members meeting on December 8, from 1:00 to 5:00 p.m. at the Hotel New Otani. The annual SEMICON Japan dinner meeting will follow the general members meeting, offering updates from attending board members.

Designed to enable open-architecture test solutions that offer true hardware and software interoperability with unparalleled technical and economic benefits, the OPENSTAR platform is now supported by 43 semiconductor, equipment and instrumentation companies worldwide. With its STC-outlined standard specifications, the architecture is accessible to all test-product vendors, enabling them to offer best-in-class, fully OPENSTAR-certified test solutions. In addition, the highly scalable and flexible OPENSTAR platform provides inherent extendibility in performance to meet emerging test requirements.

About the Semiconductor Test Consortium

The Semiconductor Test Consortium was founded in 2003 to develop a common test architecture that is completely open, documented and supported via solutions available from all ATE vendors. Open to all companies throughout the semiconductor supply chain with a vested interest in the test sector, the consortium is focused on the following goals: driving the direction of OPENSTAR; publishing the architecture and providing training programs and workshops to ensure it is truly open; and defining and managing validation procedures to ensure full vendor interoperability. Today, 43 semiconductor, equipment and instrumentation companies worldwide and 17 universities in Europe, Japan, China and the United States support the STC. More information can be found at http://www.semitest.org/

OPENSTAR is a registered trademark of the Semiconductor Test Consortium.

Semiconductor Test Consortium, Inc.

CONTACT: Fred Bode of Semiconductor Test Consortium, +1-619-297-1210 or
fbode@semitest.org; or Ellen Van Etten of MCA, +1-650-968-8900 or
evanetten@mcapr.com, for Semiconductor Test Consortium

Web site: http://www.semitest.org/

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